2019年6月25日上午9:30，故障诊断与容错控制领域国际权威学者Ronald J. Patton教授应邀在将军路校区自动化学院1号楼403会议室做题为“Fault-Tolerant Control, viewed as a Robust Control Design Problem”的学术报告，会议由自动化学院齐瑞云教授主持，自动化学院部分师生参加了报告会。
Patton教授在报告会中指出容错控制的目的是在执行器、传感器出现故障或系统参数发生变化时保持控制系统的性能。通过适当的反馈设计，可以使系统具有“容错”特性，并且可以将故障视为加性和乘性不确定性。鲁棒性和容错性是密切相关的概念，即参数变化和故障可能是闭环系统行为中不希望有的影响，也可以表现为在某些实时条件下可以估计的附加故障影响。因此，容错控制器是一种利用各种强有力的手段实现鲁棒控制的方法，其中加性和参数性故障实际上是作用于系统中的不确定性。对不确定性的鲁棒性和容错性都可以通过估计和控制的联合或集成问题来处理。与此密切相关的是分离原理，在过去的45年来它在控制理论中已广为人知。在这种背景下，考虑估计对不确定系统和系统控制变化的鲁棒性，从而理解“联合鲁棒性”是很重要的。
报告会中将概述这些原则，从而为实现良好的容错控制和对实际应用问题的鲁棒性提供策略，这对我们航空航天为背景的故障诊断和容错控制科学研究非常具有借鉴意义。
最后，Patton教授与到场的师生进行了交流互动，耐心解答了师生们所提出的学术问题。讲座结束后，Patton教授与到会师生代表合影留念。
报告人简介：
Ron J. Patton was born in Peru in 1949. He graduated at Sheffield University with BEng, MEng, PhD degrees in Electrical & Electronic Engineering and Control Systems. Ron holds the Chair in Control & Intelligent Systems Engineering at Hull University and has made a substantial contribution during 38 years to the field of modelling and Robust methods for FDI/FDD (fault detection and isolation/fault detection and diagnosis) and Fault-Tolerant Control (FTC) in dynamic systems. He has Hirsch Index h_58 and is author of 428 papers, including 158 archival journal papers and 5 books. Ron is Subject Editor of the Wiley Journal of Adaptive Control & Signal Processing. He has served on editorial boards of several other Journals in Control Engineering. During 1996-2002 Ron chaired the IFAC Safeprocess Technical Committee providing the mechanism for running of the 2006 IFAC Safeprocess 2006 Symposium held at Tsinghua University. Ron coordinated the EU research projects IQ2FD [1997-2000] and DAMADICS [2000-2004] and contributed to FP6 NeCST [2004-2007] and FP7 ADDSAFE [2010-2013], as well as to 13 UK research council grants. Current research interests are: Robust multiple-model and de-centralized strategies for FDI/FDD & FTC and Renewable Energy including mitigation of unbalanced loads in wind turbines and wave to wire control of wave energy conversion. He is Life Fellow of IEEE, Senior Member of AIAA and Fellow of the Institute of Measurement and Control.
